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dc.contributor.authorVogel, Tobias
dc.contributor.authorZintler, Alexander
dc.contributor.authorKaiser, Nico
dc.contributor.authorGuillaume, Nicolas
dc.contributor.authorLefèvre, Gauthier
dc.contributor.authorLederer, Maximilian
dc.contributor.authorSerra, Anna Lisa
dc.contributor.authorPiros, Eszter
dc.contributor.authorKim, Taewook
dc.contributor.authorSchreyer, Philipp
dc.contributor.authorEilhardt, Robert
dc.contributor.authorNasiou, Déspina
dc.contributor.authorOlivio, Ricardo
dc.contributor.authorAli, Tarek
dc.contributor.authorLehninger, David
dc.contributor.authorArzumanov, Alexey
dc.contributor.authorCHARPIN-NICOLLE, Christelle
dc.contributor.authorBourgeois, Guillaume
dc.contributor.authorGrenouillet, Laurent
dc.contributor.authorCyrille, Marie-Claire
dc.contributor.authorNavarro, Gabriele
dc.contributor.authorSeidel, Konrad
dc.contributor.authorKämpfe, Thomas
dc.contributor.authorPetzold, Stefan
dc.contributor.authorTrautmann, Christina
dc.contributor.authorMolina-Luna, Leopoldo
dc.contributor.authorAlff, Lambert
dc.date.accessioned2022-06-20T12:33:08Z
dc.date.available2022-06-20T12:33:08Z
dc.date.issued2022-06-01
dc.identifier.urihttps://tudatalib.ulb.tu-darmstadt.de/handle/tudatalib/3500
dc.identifier.urihttps://doi.org/10.48328/tudatalib-896
dc.descriptionWorkflow (jupyter notebook) of integrating a 4D-STEM scanning precession electron diffraction (SPED) dataset by creating the mean of the diffraction patterns for each label created in ASTAR. Subsequently, azimuthal integration is performed.<br> The routine is based on the packages HyperSpy and pandas for file import numpy and OpenCV for azimuthal integration. <br><br> It is part of the following paper (in review):<br> Tobias Vogel, Alexander Zintler, Nico Kaiser, Nicolas Guillaume, Gauthier Lefèvre, Maximilian Lederer, Anna Lisa Serra, Eszter Piros, Taewook Kim, Philipp Schreyer, Robert Winkler, Déspina Nasiou, Ricardo Revello Olivo, Tarek Ali, David Lehninger, Alexey Arzumanov, Christelle Charpin-Nicolle, Guillaume Bourgeois, Laurent Grenouillet, MarieClaire Cyrille, Gabriele Navarro, Konrad Seidel, Thomas Kämpfe, Stefan Petzold, Christina Trautmann, Leopoldo Molina-Luna, Lambert Alff <br>Structural and electrical response of emerging memories exposed to heavy ion radiation.en
dc.language.isoende_DE
dc.relationCites;DOI;10.5281/zenodo.4923970
dc.relationCites;DOI;10.1524/zkri.2010.1205
dc.relationCites;DOI;10.5281/zenodo.6505200
dc.relation.isreferencedbyDOI;10.1002/advs.202201806
dc.rightsCreative Commons Attribution-NonCommercial 4.0
dc.rights.urihttps://creativecommons.org/licenses/by-nc/4.0/
dc.subjectpythonde_DE
dc.subjectelectron microscopyde_DE
dc.subjectelectron diffractionde_DE
dc.subject4D STEMde_DE
dc.subject.classification3.12-02 Physikalische Chemie von Festkörpern und Oberflächen, Materialcharakterisierungde_DE
dc.subject.ddc540
dc.titleIntegration of labeled 4D-STEM SPED data for confirmation of phase identificationde_DE
dc.typeWorkflowde_DE
tud.projectEC/H2020 | 805359 | FOXONde_DE
tud.projectDFG | MO3010/3-1 | In operando Unters..de_DE
tud.projectEC/H2020 | 783176 | WAKeMeUPde_DE
tud.projectDFG | AL560 | In operando Unters..de_DE
tud.unitTUDa
tud.history.classificationVersion=2020-2024;322-02 Physikalische Chemie von Festkörpern und Oberflächen, Materialcharakterisierung


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