Advanced Electron Microscopy

 

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  • Integration of labeled 4D-STEM SPED data for confirmation of phase identification 

    Vogel, Tobias; Zintler, Alexander; Kaiser, Nico; Guillaume, Nicolas; Lefèvre, Gauthier; Lederer, Maximilian; Serra, Anna Lisa; Piros, Eszter; Kim, Taewook; Schreyer, Philipp; Eilhardt, Robert; Nasiou, Déspina; Olivio, Ricardo; Ali, Tarek; Lehninger, David; Arzumanov, Alexey; CHARPIN-NICOLLE, Christelle; Bourgeois, Guillaume; Grenouillet, Laurent; Cyrille, Marie-Claire; Navarro, Gabriele; Seidel, Konrad; Kämpfe, Thomas; Petzold, Stefan; Trautmann, Christina; Molina-Luna, Leopoldo; Alff, Lambert (2022-06-01)

  • Video of (-1-1-2)/(-121) HfO2 grain boundary, Moiré pattern 

    Petzold, Stefan; Zintler, Alexander; Eilhardt, Robert; Kaiser, Nico; Piros, Eszter; Sharath, S. U.; Vogel, Tobias; Major, Márton; Molina-Luna, Leopoldo; Alff, Lambert (2019-04-08)