Please refer to the article to have an general description of methods, characterizations and results.

- Sample names in the raw data file are described in "Sample_names.txt" document.

- The "Data" folder contains XRD and SQUID raw data. Please refer to the sample names to be able and associate them to a specific measurement.

- Additional info on abbreviations used in sample names:
	DHS: domed hot stage - annealing method of choice. Used to conduct temperature dependent XRD measurements.
	PA: post annealed
	GM: general measurement, associated to symmetric geometry measurements (Theta-2Theta)
	Soller: those XRD measurements were conducted with soller slits (instead of a Ge(220)x2 monochromator)
	GIXRD: grazing incidence XRD measurement
	XRR: X-ray reflectivity measurement
	IP: In-Plane - orientation of the external field during measurement (relatively to the sample)
	OOP: Out-of-plane - orientation of the external field during measurement (relatively to the sample)
	MH: Magnetization (M) vs External field (H) hysteresis loops

- An excel sheet describes the operated conversion from peak position (xc) to c-parameter for the different samples.

-Concerning XRD data:
RAS, ASC and RAW files are included. These come from the measurement device. The RAS files include information on the diffractometer optics employed for the specific measurements. To import the data, please use the ".txt" files for each measurement.
Folder "XRD_As_Implanted" contains the diffraction patterns of samples measured before annealing them.
Folder "XRD_Annealing" contains the diffraction patterns of samples measured during and before annealing
DHS files are associated to samples that underwent temperature dependent measurement. The sequence of commands may differ differ from sample to sample. For reference, and individual measurement file is named for example: "S5.1_1E17_DHSanneal_350C_01_0001_0050-0_C". Here, "S5.1_1E17_DHSanneal_350C_" is the repeated file name for all measurement of that sequence; the following "0001" represents the step number in that sequence; "0050-0_C" describes the temperature at which that measurement was collected (after adequate dwelling time to allow for temperature homogeneity in the sample).
Samples annealed at max 150°C, named "DHS_150C" in the folder, are the ones for which a lattice elongation was determined in the article.
Please note that some of them were capped with gold prior to annealing, to prevent oxidation.

-Concerning SQUID data:
For each measurement, DAT, DIAG and LASTSCAN files are provided. DAT can be used for plotting the data. Together with them, SEQ files are also provided. For our measurement an MPMS-XL was used. The SEQ files includes the instructions and details that the instrument must follow to complete a measurement (e.g., density of data points collected in a specific field range, oscillation frequency, temperature, etc.).
Before every hysteresis loop (within 6 T and -6 T), a "virgin curve" is collected, which corresponds to the first magnetisation curve, from 0 T to 6 T. Before every measurement, the field is increased to 6 T and then it oscillates down to 0 T to remove all traces of residual magnetization in the sample.
For data analysis, only the columns associated to Field (Oe) and Long moment (emu) were used. Before further evaluation, the demagnetization contribution must be removed so that, once saturation is reached at higher external field values, the "Long moment" values will be arranged horizontally in the plot (which should look like, for each branch of the loop, as a sigmoidal growth plot).